Infrared-optical characterization of metallic island films

Applied Spectroscopy

Volumn 51, Issue 6, 1997, Pages 902-904

  Roeseler, Arnulf ^a   Korte, Ernst Heiner ^a  

^a Institutsteil Berlin   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; INFRARED SPECTROSCOPY; LIGHT ABSORPTION;

METALLIC ISLAND FILMS; SURFACE ENHANCED INFRARED ABSORPTION (SEIRA);

METALLIC FILMS;

EID: 0031166537     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971941223     Document Type: Article

References (6)