A new surface science in situ transmission and reflection electron microscope

Review of Scientific Instruments

Volumn 69, Issue 1-2, 1998, Pages 440-447

  Marshall, M T ^a   McDonald, M L ^a,b   Tong, X ^a,c   Yeadon, M ^a   Gibson, J M ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; INFRARED LAMPS; LENSES; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SURFACES; THERMOCOUPLES; THIN FILMS; VACUUM APPLICATIONS;

ELECTROMAGNETIC DEFLECTORS; ELECTROMAGNETIC LENSES; REFLECTION ELECTRON MICROSCOPE; SURFACE HIGH ENERGY ELECTRON BEAM APPARATUS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031999295     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148679     Document Type: Article

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