Spectroscopic ellipsometry study of nickel oxidation in alkaline solution

Electrochimica Acta

Volumn 42, Issue 8, 1997, Pages 1253-1267

  De Souza, L M M ^a,b   Kong, F P ^a   McLarnon, F R ^a   Muller, R H ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Alkaline electrolyte; Ellipsometry; Nickel; Oxide layer; Voltammetry

Indexed keywords

ANODIC OXIDATION; CYCLIC VOLTAMMETRY; ELECTROCHEMICAL ELECTRODES; ELECTROCHEMISTRY; ELECTROLYSIS; ELECTROLYTES; ELLIPSOMETRY;

ALKALINE ELECTROLYTES;

NICKEL;

EID: 0030679099     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(96)00298-8     Document Type: Article

References (35)

1. L. D. Burke and T. Twoney, J. Electroanal. Chem. 162, 101 (1984).
2. G. Barrai, F. Njanjo-Evoke and S. Maximovitch, Electrochimica Acta 40, 70 (1995); 40, 2828 (1985).
3. G. Barrai, F. Njanjo-Evoke and S. Maximovitch, Electrochimica Acta 40, 70 (1995); 40, 2828 (1985).
4. B. Beden, D. Floner, J. M. Leger and C. Lamy, Surface Science 162, 822 (1985).
5. R. S. Schrebler Guzman, J. R. Vilche and A. J. Arvia, J. Electrochem. Soc. 125, 1578 (1978).
6. B. Dougall and M. Cohen, J. Electrochem. Soc. 124, 1185 (1977).
7. Y. Mo, E. Hwang and D. Scherson, J. Electrochem. Soc. 143, 37 (1996).
8. C. C. Streinz, S. Motupally and J. W. Weidner, J. Electrochem. Soc. 142, 4051 (1995).
9. J. L. Ord, Surface Science 56, 413 (1976).
10. J. O. Zerbino, C. de Pauli, D. Posadas and A. J. Arvia, J. Electroanal. Chem. 330, 675 (1992).
11. L. J. Oblonsky and T. M. Devine, J. Electrochem. Soc. 142, 3677 (1995).
12. J. Desilvestro, D. A. Corrigan and M. J. Weaver, J. Phys. Chem. 90, 6408 (1986).
13. F. Hahn, B. Beden, M. J. Croissant and C. Lamy, Electrochimica Acta 31, 335 (1986).
14. J. L. Ord, J. C. Clayton and D. J. DeSmet, J. Electrochem. Soc. 124, 1754 (1977).
15. W. Paik and Z. Szklaska-Smialowska, Surface Science 96, 401 (1980).
16. A. A. Wronkowska, Surface Science 214, 507 (1989).
17. C. Chao and Szklarska-Smialowska, Surface Science 96, 426 (1980).
18. M. A. Hopper and J. L. Ord, J. Electrochem. Soc. 120, 183 (1973).
19. P. W. Lu and S. Srinivasan, J. Electrochem. Soc. 125, 1416 (1978).
20. W. Visscher and E. Barendrecht, Surface Science 135, 436 (1983).
21. B. MacDougal and M. J. Graham, J. Electrochem. Soc. 128, 2321 (1981).
22. M. Okuyama and S. Haruyama, Corros. Sci. 14, 1 (1974).
23. R. H. Muller and J. C. Farmer, Rev. Sci. Instrum. 55, 371 (1984).
24. National Instruments Corp., Austin, Texas 78730-5039.
25. R. W. Crocker and R. H. Muller, FlexiFit - A Software Tool for Interpreting and Predicting Spectroscopic Ellipsometer Measurements, Lawrence Berkeley National Laboratory Report No. LBID-1900 (August 1992).
26. D. E. Aspnes, in The Accurate Determination of Optical Properties by Ellipsometry, in Handbook of Optical Constants of Solids (Edited by E. D. Palik), Ch. 5, Academic Press, Orlando FL (1985).
27. L. Hanekamp, S. J. H. Brader and G. A. Bootsma, Surface Science 135, 383 (1983).
28. E. D. Palik (Ed.), Handbook of Optical Constants of Solids, Academic Press, Orlando FL (1985).
29. R. W. Crocker and R. H. Muller, in Structural Transformation of Nickel Hydroxide Films during Anodic Oxidation, Ph.D. Thesis, University of California Berkeley; Lawrence Berkeley National Laboratory Report No. LBL-32136 (May 1992).
30. H. Birks and L. Meyer, in Introduction to High Temperature Oxidation of Metals, Plenum Press, London (1972).
31. S. Deckers, F. H. P. M. Habraken and W. F. Van der Weg, Applied Surface Science 45, 207 (1990).
32. Z. Szklarska-Smialowska and H. Oranowska, Corros. Sci. 16, 355 (1976).
33. R. W. Crocker and R. H. Muller, Structural Transformation of Nickel Hydroxide Films During Anodic Oxidation, Electrochemical Society Meeting Extended Abstracts, Vol. 92-2, p. 132, The Electrochemical Society, Pennington NJ (October 1992).
34. R. H. Muller and C. G. Smith, Surface Science 96, 375 (1980).
35. S. T. Mayer and R. H. Muller, J. Electrochem. Soc. 135, 2133 (1988).