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Volumn 7, Issue 2-5, 1998, Pages 250-254

Studies of defects and impurities in diamond thin films

Author keywords

Luminescence; Micro Raman spectroscopy; Silicon impurity; Thin film diamond

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DEFECTS; IMPURITIES; LUMINESCENCE; PLASMAS; RAMAN SPECTROSCOPY; SILICON; THIN FILMS;

EID: 0031995285     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(97)00265-3     Document Type: Article
Times cited : (20)

References (33)
  • 22
    • 0041647970 scopus 로고    scopus 로고
    • T.D. Moustakas, J.I. Pankove, Y. Hamakawa (Eds.), Materials Research Society, Pittsburg, PA
    • R.J. Graham, in: T.D. Moustakas, J.I. Pankove, Y. Hamakawa (Eds.), Wide Band Gap Semiconductors, Vol. 242, Materials Research Society, Pittsburg, PA. p. 97.
    • Wide Band Gap Semiconductors , vol.242 , pp. 97
    • Graham, R.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.