Sensitivity improvement of an electro-optic high-impedance probe

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 1, 1998, Pages 235-239

  Shinagawa, Mitsuru ^a,b   Nagatsuma, Tadao ^a,b   Miyazawa, Shintaro ^b  

^a IEEE   (Japan)

^b NTT CORPORATION   (Japan)

Author keywords

Board testing; BTO (= Bi 12TiO 20); Electro optic effect; Electro optic sampling; High impedance probe; Laser diode; Oscilloscope; Pulse laser

Indexed keywords

ELECTRIC IMPEDANCE; ELECTROOPTICAL DEVICES; SEMICONDUCTOR LASERS;

BOARD TESTING; ELECTROOPTICAL CRYSTALS;

PROBES;

EID: 0031988377     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.728825     Document Type: Article

References (7)

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