Determination of HEMT's noise parameters versus temperature using two measurement methods

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 1, 1998, Pages 6-10

  Caddemi, Alina ^a   Di Paola, Alessandra ^a   Sannino, Mario ^a  

^a UNIVERSITY OF PALERMO   (Italy)

Author keywords

Characterization; HEMT; Low noise; Measurement; Microwave; Temperature

Indexed keywords

COMPUTER SIMULATION; MICROWAVES; SPURIOUS SIGNAL NOISE; TEMPERATURE;

NOISE PARAMETERS; SCATTERING PARAMETERS;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0031988318     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.728779     Document Type: Article

References (8)

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