Comparison between two measuring methods for complete characterization of low-noise HEMTs at microwaves

1996 26th European Microwave Conference, EuMC 1996

Volumn 1, Issue , 1996, Pages 186-190

  Caddemi, A ^a   Di Paola, A ^a   Sannino, M ^a  

^a UNIVERSITY OF PALERMO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL APPLICATIONS; SCATTERING PARAMETERS;

FIGURE MEASUREMENT; LOW NOISE; MEASURING METHOD;

RESEARCH LABORATORIES;

EID: 0043281980     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1996.337549     Document Type: Conference Paper

References (8)

1. A Caddemi, G. Martines, M. Sannino, "Automatic characterization and modeling of microwave low-noise HEMTs", IEEE Trans. on Instrumentation and Measurements., vol. 41, pp. 946-950, Dec. 1992.
2. G. Martines, M. Sannino, "The determination of the noise, gain and scattering parameters of microwave transistors (HEMTs) using only an automatic noise figure test set", IEEE Trans. on Microwave Theory and Techniques, pp. 1105-1113, July 1994.
3. A. Caddemi, G. Martines. M. Sannino, "HEMT for low noise microwaves: CAD oriented modeling", IEEE Trans. on Microwave Theory and Techniques, Special Issue on Process-Oriented Microwave CAD and Modeling, vol. 40, pp. 1441-1445, July 1992.
4. A. Caddemi, G. Martines, M. Sannino, "Statistical modeling of pseudomorphic HEMTs from automated noise and scattering measurements", Proceedings of the IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits, pp. 212-218, Ithaca (New York), Aug. 1993.
5. E. Calandra, G. Martines, M. Sannino, "Characterization of GaAs FET's in terms of noise, gain and scattering parameters through a noise parameter test set", IEEE Trans. on Microwave Theory and Techniques, vol. MTT-32, pp. 231-237, March 1984.
6. M. Pospieszalski, "Modeling of noise parameters of MESFETs and MODFETs and their frequency and temperature dependence", IEEE Trans. Microwave Theory Tech., vol. MTf-37, pp. 1340-1350, Sept.1989.
7. P. Tasker, W. Reinert, J. Braunstein, M. Schlechtweg, "Direct extraction of all four transistor noise parameters from a single noise figure measurement", Proc. 22nd European Microwave Conference, Helsinki, Finland, pp. 157-162, Aug. 1992.
8. G. Dambrine, H. Happy, F. Danneville, A. Cappy, "A new method for on wafer noise measurement", IEEE Trans. Microwave Theory Tech., vol. M1TT41, pp. 375-381, March 1993.