Measurement of surface orientation in uniaxial poly(ethylene terephthalate) films using polarised specular reflectance Fourier transform infrared microscopy

Vibrational Spectroscopy

Volumn 10, Issue 2, 1996, Pages 253-259

  Everall, Neil J ^a   Chalmers, John M ^a   Local, Andrea ^a   Allen, Simon ^a  

^a AKZO NOBEL CENTRAL RESEARCH   (Netherlands)

Author keywords

External reflectance; Infrared spectrometry, fourier transform; Microscopy; Poly(ethylene terephthalate); Surface orientation

Indexed keywords

EID: 0003203926     PISSN: 09242031     EISSN: None     Source Type: Journal    
DOI: 10.1016/0924-2031(95)00036-4     Document Type: Article

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