Crystallographic image processing approach to crystal structure determination

Journal of Microscopy

Volumn 190, Issue 1-2, 1998, Pages 249-261

  Li, F H ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

Crystal structure determination; Electron diffraction; High resolution electron microscopy; Image deconvolution; Image processing; Phase extension

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; IMAGE RESOLUTION;

CONDITION; CRYSTAL STRUCTURE DETERMINATION; DEFOCUS; DIFFRACTION INTENSITY; IMAGE DECONVOLUTION; IMAGE PROCESSING TECHNIQUE; IMAGES PROCESSING; PHASE EXTENSION; PROCESSING APPROACH; WEAK PHASE OBJECT;

ELECTRONS;

COMPUTER SIMULATION; CRYSTAL STRUCTURE; DIAGNOSTIC APPROACH ROUTE; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE QUALITY; PRIORITY JOURNAL; REVIEW; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031918216     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.2980849.x     Document Type: Review

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