Quantitative determination of lattice parameters from CBED patterns: Accuracy and performance

Ultramicroscopy

Volumn 70, Issue 3, 1998, Pages 145-159

  Wittmann, R ^a   Parzinger, C ^a   Gerthsen, D ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

Convergent beam electron diffraction (CBED); Data processing image processing

Indexed keywords

ALGORITHMS; ALUMINUM; DATA PROCESSING; ELECTRON DIFFRACTION; IMAGE PROCESSING;

CONVERGENT BEAM ELECTRON DIFFRACTION;

LATTICE CONSTANTS;

ACCURACY; ALGORITHM; ARTICLE; ELECTRON DIFFRACTION; IMAGE PROCESSING; IMAGE QUALITY; IMAGING SYSTEM; OPTICAL RESOLUTION;

EID: 0031799178     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00107-1     Document Type: Article

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