Different types of HOLZ-line interactions and their use in structure factor determination

Ultramicroscopy

Volumn 65, Issue 1-2, 1996, Pages 1-12

  Bokel, R M J ^a   Schapink, F W ^a   Tichelaar, F D ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

convergent beam electron diffraction; structure factor determination

Indexed keywords

ANGLE MEASUREMENT; CRYSTAL SYMMETRY; ELECTRON BEAMS; ELECTRON SCATTERING; ERROR ANALYSIS; LEAST SQUARES APPROXIMATIONS;

CHARACTERISTIC SPLITTING CONFIGURATIONS; CONVERGENT BEAM ELECTRON DIFFRACTION; SELECTED AREA ELECTRON DIFFRACTION;

ELECTRON DIFFRACTION;

ARTICLE; ELECTRON MICROSCOPY;

EID: 0030250925     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00047-2     Document Type: Article

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