IDD waveforms analysis for testing of domino and low voltage static CMOS circuits

Proceedings of the IEEE Great Lakes Symposium on VLSI

Volumn , Issue , 1998, Pages 243-248

  Soeleman, Hendrawan ^a   Somasekhar, Dinesh ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ERROR ANALYSIS; WAVEFORM ANALYSIS;

QUIESCENT POWER SUPPLY CURRENT;

INTEGRATED CIRCUIT TESTING;

EID: 0031699114     PISSN: 10661395     EISSN: None     Source Type: None    
DOI: 10.1109/GLSV.1998.665243     Document Type: Conference Paper

References (10)

1. C. Thibeault Detection and location of faults and defects using digital signal processing 13 IEEE International VLSI Test Symposium 262 267 13 IEEE International VLSI Test Symposium Princeton NJ 1995
2. E. Isern J. Figueras IDDq Test and Diagnosis of CMOS Circuits IEEE Design & Test of Computers 12 4 60 67 1995
3. R. C. Aitken Diagnosis of Leakage Faults with IDDq Journal of Electronic Testing: Theory and Applications 3 4 367 376 December 1992
4. R. Z. Makki S-T Su T. Nagle Transient Power Supply Current Testing of Digital CMOS Circuits Proceedings of International Test Conference 892 901 Proceedings of International Test Conference 1995-October
5. W. Maly P. Nigh Built-in Current Testing-A Feasibility Study Proceedings of International Conference on Computer-Aided Design 340 343 Proceedings of International Conference on Computer-Aided Design 1988-November
6. J. M. Soden C. F. Hawkins A. C. Miller Identifying Defects in Deep-Submicron CMOS ICs IEEE Spectrum 33 9 66 71 September 1996
7. A. E. Gattiker W. Maly Current Signature Proceedings of IEEE VLSI Test Conference 112 117 Proceedings of IEEE VLSI Test Conference 1996
8. R. C. Aitken Faults Location with Current Monitoring Proceedings of International Test Conference 623 632 Proceedings of International Test Conference 1991
9. J. M. Soden C. F. Hawkins R. V. Gulati W. Mao IDDQ Testing: A Review Journal of Electronic Testing: Theory and Applications 291 303 1992
10. J. Frenzel P. Marinos A Comparison of Methods for Supply Current Analysis Proceedings of IEEE 1991 Custom Integrated Circuits Conference 13.3.1 13.3.4 Proceedings of IEEE 1991 Custom Integrated Circuits Conference