|
Volumn 442, Issue 1-2, 1998, Pages 169-174
|
Micromorphology changes of silicon oxide on Si(111) during current oscillations: A comparative in situ AFM and FTIR study
a a a a |
Author keywords
Photocurrent; Silicon oxide; Spectroscopy
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MORPHOLOGY;
OSCILLATIONS;
PH EFFECTS;
PHOTOCONDUCTIVITY;
SURFACE ROUGHNESS;
PHOTOELECTROCHEMISTRY;
SILICA;
|
EID: 0031679350
PISSN: 15726657
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0728(97)00476-2 Document Type: Article |
Times cited : (26)
|
References (27)
|