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Volumn 442, Issue 1-2, 1998, Pages 169-174

Micromorphology changes of silicon oxide on Si(111) during current oscillations: A comparative in situ AFM and FTIR study

Author keywords

Photocurrent; Silicon oxide; Spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MORPHOLOGY; OSCILLATIONS; PH EFFECTS; PHOTOCONDUCTIVITY; SURFACE ROUGHNESS;

EID: 0031679350     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(97)00476-2     Document Type: Article
Times cited : (26)

References (27)
  • 2
    • 0002168865 scopus 로고
    • J.O'M. Bockris, B. Conway (Eds.), Chap. 2, Plenum, New York
    • J. Wojtowicz, in: J.O'M. Bockris, B. Conway (Eds.), Modern Aspects of Electrochemistry, Vol. 8, Chap. 2, Plenum, New York (1972).
    • (1972) Modern Aspects of Electrochemistry , vol.8
    • Wojtowicz, J.1
  • 18
    • 85009407506 scopus 로고    scopus 로고
    • accepted for publication
    • H.J. Lewerenz, accepted for publication in J. Phys. Chem. (Special Issue).
    • J. Phys. Chem. , Issue.SPEC. ISSUE
    • Lewerenz, H.J.1
  • 22
    • 0346720752 scopus 로고    scopus 로고
    • S.A. Campbell, H.J. Lewerenz (Eds.), Fundamentals, Chap. 3, Wiley, London
    • H.J. Lewerenz, H. Jungblut, in: S.A. Campbell, H.J. Lewerenz (Eds.), Semiconductor Micromachining, Vol. I (Fundamentals), Chap. 3, Wiley, London (1997)
    • (1997) Semiconductor Micromachining , vol.1
    • Lewerenz, H.J.1    Jungblut, H.2
  • 24
    • 84913455729 scopus 로고
    • Akademie-Verlag Berlin
    • 2, Akademie-Verlag Berlin (1984)
    • (1984) 2
    • Hübner, K.1
  • 27
    • 0346090178 scopus 로고    scopus 로고
    • Thesis, Technische Universität Berlin
    • O. Nast, Thesis, Technische Universität Berlin (1996).
    • (1996)
    • Nast, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.