Anti-corrugation and nitrogen c(2 × 2) on Cr(100): STM on atomic scale and quantitative LEED

Surface Science

Volumn 396, Issue 1-3, 1998, Pages 78-86

  Sporn, M ^a   Platzgummer, E ^a   Pinczolits, M ^a,b   Hebenstreit, W ^a   Schmid, M ^a   Hofer, W ^a   Varga, P ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Chromium; Low energy electron diffraction (LEED); Low index single crystal surfaces; Metallic surfaces; Nitrogen; Scanning tunneling microscopy; Surface relaxation and reconstruction; Surface segregation

Indexed keywords

ADSORPTION; ATOMS; CHEMICAL BONDS; CHROMIUM; LOW ENERGY ELECTRON DIFFRACTION; NITROGEN; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS;

ANTI CORRUGATION; METALLIC SURFACES; SURFACE RECONSTRUCTION; SURFACE SEGREGATION;

SURFACE STRUCTURE;

EID: 0031673523     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00660-2     Document Type: Article

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