Photoemission electron microscopy of Schottky contacts

Surface Science

Volumn 396, Issue 1-3, 1998, Pages 411-421

  Giesen, Margret ^a   Phaneuf, Raymond J ^a,b   Williams, Ellen D ^a   Einstein, Theodore L ^a  

^a Bldg 142   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Electron emission measurements; Metal semiconductor interfaces; Polycrystalline thin films; Semiconductor insulator interfaces; Silicon; Surface electronic phenomena (work function, surface potential, surface states, etc.)

Indexed keywords

ELECTRON MICROSCOPY; GROWTH (MATERIALS); HETEROJUNCTIONS; INTERFACES (MATERIALS); SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DIODES; SILVER; TEMPERATURE; THIN FILMS;

PHOTOEMISSION ELECTRON MICROSCOPY; POLYCRYSTALLINE THIN FILMS; SCHOTTKY CONTACT; SURFACE STATE;

SURFACE PHENOMENA;

EID: 0031651277     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00696-1     Document Type: Article

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