Characterization of co-electrodeposited and selenized CIS (CuInSe2) thin films

Thin Solid Films

Volumn 298, Issue 1-2, 1997, Pages 92-97

  Fernandez, A M ^a   Sebastian, P J ^a,c   Calixto, M E ^a   Gamboa, S A ^a   Solorza, O ^b  

^a INSTITUTO DE INVESTIGACIONES EN MATERIALES   (Mexico)

^b DEPARTAMENTO DE FÍSICA   (Mexico)

^c INSTITUTO DE CIENCIAS FÍSICAS   (Mexico)

Author keywords

Electrical properties and measurements; Selenium; Structural properties; Surface morphology

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARRIER CONCENTRATION; COPPER ALLOYS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC VARIABLES MEASUREMENT; ELECTRODEPOSITION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

COPPER INDIUM SELENIDES; PHOTOELECTROCHEMICAL METHOD; SELENIZATION;

CONDUCTIVE FILMS;

EID: 0031118804     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09310-8     Document Type: Article

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