메뉴 건너뛰기




Volumn Part F133492, Issue , 1998, Pages 685-691

Thermally enhanced flip-chip BGA with organic substrate

Author keywords

[No Author keywords available]

Indexed keywords

BALL GRID ARRAYS; INTEGRATED CIRCUIT INTERCONNECTS; NETWORK COMPONENTS; SUBSTRATES; EUTECTICS; FLIP CHIP DEVICES; SOLDERING ALLOYS;

EID: 0031636708     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.1998.678772     Document Type: Conference Paper
Times cited : (7)

References (14)
  • 7
    • 0242555164 scopus 로고
    • Surface laminate circuit and flip chip attach packaging
    • June 3-5
    • Y. Tsukada, S. Tsuchida, Y. Mashiomoto, " Surface Laminate Circuit and Flip Chip Attach Packaging, " ProcJthlMC, June 3-5, p. 252, 1992.
    • (1992) ProcJthlMC , pp. 252
    • Tsukada, Y.1    Tsuchida, S.2    Mashiomoto, Y.3
  • 8
    • 0029218676 scopus 로고
    • Reliability investigations of fluxless flip-chip interconnections on green tape ceramic substrates
    • J. Kloeser, E. Zakel, F. BechtoldandH. Reichl, "Reliability Investigations of Fluxless Flip-Chip Interconnections on Green Tape Ceramic Substrates, " in Proc. 45th ECTC, pp. 1179-1190, 1995.
    • (1995) Proc. 45th ECTC , pp. 1179-1190
    • Kloeser, J.1    Zakel, E.2    Bechtoldand, F.3    Reichl, H.4
  • 9
    • 0030166337 scopus 로고    scopus 로고
    • Tutorial: Soft errors induced by alpha particles
    • June
    • L. Lantz n, " Tutorial: Soft Errors Induced By Alpha Particles, " IEEE Trans. Reliability, vol. 45, no. 2, pp. 174-179, 1996 June.
    • (1996) IEEE Trans. Reliability , vol.45 , Issue.2 , pp. 174-179
    • Lantzn, L.1
  • 10
    • 0027746688 scopus 로고
    • A method of fatigue life prediction for surface-mount solder joints of electronic devices by mechanical fatigue test
    • Y. Uegai, S. Tani, A. Inoue, S. Yoshioka, K. Tamura, " A method of fatigue life prediction for surface-mount solder joints of electronic devices by mechanical fatigue test, " in Proc. ASMElnt. Electron. Pkg. Conf., pp. 493-498, 1993.
    • (1993) Proc. ASMElnt. Electron. Pkg. Conf. , pp. 493-498
    • Uegai, Y.1    Tani, S.2    Inoue, A.3    Yoshioka, S.4    Tamura, K.5
  • 11
    • 0001067795 scopus 로고
    • Determination of the cyclic stress-strain curve
    • R. W. Landgraf, J. Morrow and T. Endo, " Determination of the cyclic stress-strain curve, " J. Mater., vol. 4, no. 1, pp. 176-188, 1969.
    • (1969) J. Mater. , vol.4 , Issue.1 , pp. 176-188
    • Landgraf, R.W.1    Morrow, J.2    Endo, T.3
  • 14
    • 85053905449 scopus 로고
    • A method of fatigue life prediction for surface-mount solder joints of electronic devices by mechanical fatigue test
    • Y. Uegai, S. Tani, A. Inoue, S. Yoshioka and K. Tamura, " A method of fatigue life prediction for surface-mount solder joints of electronic devices by mechanical fatigue test, " in Proc. JSME 21st Fatigue Symp., 1992, pp. 39-42.
    • (1992) Proc. JSME 21st Fatigue Symp. , pp. 39-42
    • Uegai, Y.1    Tani, S.2    Inoue, A.3    Yoshioka, S.4    Tamura, K.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.