Growth and structure of internal Cu/Al2O3 and Cu/Ti/Al2O3 interfaces

Acta Materialia

Volumn 46, Issue 3, 1998, Pages 759-772

  Dehm, G ^a   Scheu, C ^a   Ruhle M ^a   Raj, R ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHEMICAL BONDS; COPPER; CRYSTAL LATTICES; CRYSTAL ORIENTATION; INTERFACES (MATERIALS); METALLIC FILMS; MOLECULAR BEAM EPITAXY; NUCLEATION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY;

INTERFACIAL WIDTH;

MULTILAYERS;

EID: 0031599093     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(97)00257-7     Document Type: Article

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