A microindentation method for estimating interfacial shear strength and its use in studying the influence of titanium transition layers on the interface strength of epitaxial copper films on Sapphire

Acta Materialia

Volumn 45, Issue 2, 1997, Pages 489-499

  Dehm, G ^a   Ruhle M ^a   Conway, H D ^b   Raj, R ^b,c  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b Cornell University   (United States)

^c UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DEFORMATION; INTERFACES (MATERIALS); LOADS (FORCES); MATHEMATICAL MODELS; METALLIC FILMS; SAPPHIRE;

APPROXIMATE ELASTIC MODEL; INDENTATION DEPTH; INTERFACIAL SHEAR STRENGTH; LOAD DISPLACEMENT MEASUREMENT; MICROINDENTATION METHOD; TITANIUM TRANSITION LAYER;

SHEAR STRENGTH;

EID: 0031077561     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(96)00213-3     Document Type: Article

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