Secondary fluorescence correction formulae for X-ray microanalysis - II self-supporting discs

Ultramicroscopy

Volumn 68, Issue 2, 1997, Pages 95-107

  Anderson, I M ^a,b   Bentley, J ^a   Carter, C B ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Minnesota   (United States)

Author keywords

X ray microanalysis

Indexed keywords

FLUORESCENCE; X RAY ANALYSIS;

SECONDARY FLUORESCENCE; X RAY MICROANALYSIS;

X RAY MICROSCOPES;

ARTICLE; CALCULATION; FLUORESCENCE; GEOMETRY; IONIZATION; RADIATION SCATTERING; X RAY MICROANALYSIS;

EID: 0031570702     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00016-8     Document Type: Article

References (5)

1. [1] I.M. Anderson, J. Bentley, C.B. Carter, J. Microsc. 178 (1995) 226-239.
2. [2] I.M. Anderson, J. Bentley, C.B. Carter, Ultramicroscopy 68 (1997) 77-94.
3. [3] M. Abramowitz, I.A. Stegun, Handbook of Mathematical Functions, Dover Publications, New York, 1965.
4. [4] J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig Jr, C.E. Lyman, C. Fiori, E. Lifshin, Scanning Electron Microscopy and X-ray Microanalysis, 2nd ed. Plenum Press, New York, 1992, p. 412.
5. [5] I.M. Anderson, J. Bentley, Microbeam Anal. 4 Suppl. (1995) 285-286.