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Volumn 65, Issue 10, 1997, Pages 1975-1982

Physical properties of epoxy molding compound for semiconductor encapsulation according to the coupling treatment process change of silica

Author keywords

Epoxy molding compound; Semiconductor encapsulation; Silane coupling

Indexed keywords

DRYING; ENCAPSULATION; PLASTICS FILLERS; PLASTICS MOLDING; RESIDUAL STRESSES; SEMICONDUCTOR DEVICE MANUFACTURE; SHEET MOLDING COMPOUNDS; SILANES; SILICA; STRENGTH OF MATERIALS;

EID: 0031556218     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4628(19970906)65:10<1975::aid-app15>3.0.co;2-w     Document Type: Article
Times cited : (26)

References (21)
  • 10
    • 3743126712 scopus 로고    scopus 로고
    • U.S. Pat. 5,189,082 (1993); U.S. Pat. 5,428,057 (1995)
    • W. G. Kim and T. Y. Nam, U.S. Pat. 5,189,082 (1993); U.S. Pat. 5,428,057 (1995).
    • Kim, W.G.1    Nam, T.Y.2
  • 11
    • 3743135625 scopus 로고
    • W. G. Kim, SAITEC, 2, 150 (1989).
    • (1989) SAITEC , vol.2 , pp. 150
    • Kim, W.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.