Macroscopic size effects in second harmonic generation from Si(111) coated by thin oxide films: The role of optical casimir nonlocality

Physical Review Letters

Volumn 78, Issue 1, 1997, Pages 46-49

  Aktsipetrov, O A ^a   Fedyanin, A A ^a   Mishina, E D ^a   Nikulin, A A ^a   Rubtsov, A N ^a   van Hasselt, C W ^b   Devillers, M A C ^b   Rasing, Th ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELDS; ELECTRON SCATTERING; ELLIPSOMETRY; GREEN'S FUNCTION; HELIUM NEON LASERS; INTERFACES (MATERIALS); PHOTONS; POLARIZATION; REFRACTIVE INDEX; SEMICONDUCTING SILICON; SILICA; THIN FILMS;

BREWSTER ANGLE OF INCIDENCE; ELECTRON ELECTRON INTERACTION; NEAR INDEX MATCHING FLUID; OPTICAL CASIMIR NONLOCALITY; OXIDE THICKNESS;

SECOND HARMONIC GENERATION;

EID: 0031555607     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.46     Document Type: Article

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