Verification of three-dimensional charge transport simulations using ion microbeams

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 470-477

  Horn, K M ^b   Dodd, P E ^b   Breese, M B H ^a,b   Doyle, B L ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; ION BEAMS;

ION MICROBEAMS;

FIELD EFFECT TRANSISTORS;

EID: 0031548992     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00342-X     Document Type: Article

References (5)

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4. J.F. Ziegler, J.P. Biersack and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon Press, New York, 1985).
5. J.R. Hauser, S.E. Diehl-Nagle, A.R. Knudson, A.B. Campbell, W.J. Stapor and P. Shapiro, IEEE Trans. Nucl. Sci. 32 (1985) 4115.