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Volumn 127-128, Issue , 1997, Pages 282-285

Study on emission yields of negative- and positive-ion induced secondary electron from thin SiO2 film

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CHARGE; ELECTRIC INSULATORS; ELECTRON EMISSION; ION BOMBARDMENT; ION IMPLANTATION; LEAKAGE CURRENTS; THIN FILMS;

EID: 0031547829     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)00940-8     Document Type: Article
Times cited : (4)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.