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Volumn 127-128, Issue , 1997, Pages 282-285
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Study on emission yields of negative- and positive-ion induced secondary electron from thin SiO2 film
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT DENSITY;
ELECTRIC CHARGE;
ELECTRIC INSULATORS;
ELECTRON EMISSION;
ION BOMBARDMENT;
ION IMPLANTATION;
LEAKAGE CURRENTS;
THIN FILMS;
KINETIC EMISSION;
SILICA;
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EID: 0031547829
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(96)00940-8 Document Type: Article |
Times cited : (4)
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References (16)
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