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Volumn 174, Issue 1-4, 1997, Pages 455-463

CMR films structure as a function of growth and processing

Author keywords

CMR; Films; Growth; La0.67Ca0.33MnO3; Magnetization; STM; Transport

Indexed keywords

ANNEALING; ARGON; ELECTRIC RESISTANCE MEASUREMENT; FILM GROWTH; LANTHANUM COMPOUNDS; MAGNETIZATION; MICROSTRUCTURE; OXYGEN; PEROVSKITE; PULSED LASER APPLICATIONS; SCANNING TUNNELING MICROSCOPY; SPUTTER DEPOSITION;

EID: 0031547213     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)01142-6     Document Type: Article
Times cited : (20)

References (11)
  • 3
    • 0029755374 scopus 로고    scopus 로고
    • Epitaxial oxide thin films II
    • Eds. J.S. Speck, D.K. Fork, R.M. Wolf and T. Shiosaki, Materials Research Society, Pittsburgh
    • M.E. Hawley, X.D. Wu, P.N. Arendt, C.D. Adams, M.F. Hundley and R.H. Heffner, in: Epitaxial Oxide Thin Films II, Eds. J.S. Speck, D.K. Fork, R.M. Wolf and T. Shiosaki, Mater. Res. Soc. Symp. Proc., Vol. 401 (Materials Research Society, Pittsburgh, 1996) p. 531.
    • (1996) Mater. Res. Soc. Symp. Proc. , vol.401 , pp. 531
    • Hawley, M.E.1    Wu, X.D.2    Arendt, P.N.3    Adams, C.D.4    Hundley, M.F.5    Heffner, R.H.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.