Microstructural study of CMR films as a function of growth temperature, as-deposited and annealed

Materials Research Society Symposium - Proceedings

Volumn 401, Issue , 1996, Pages 531-536

  Hawley, M E ^a   Wu, X D ^a   Arendt, P N ^a   Adams, C D ^a   Hundley, M F ^a   Heffner, R H ^a  

^a Center for Materials Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CRYSTAL MICROSTRUCTURE; FILM GROWTH; GRAIN SIZE AND SHAPE; LANTHANUM COMPOUNDS; OXIDES; PULSED LASER APPLICATIONS; SPUTTER DEPOSITION; THERMAL EFFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

COLOSSAL MAGNETORESISTIVE PEROVSKITE; COMPLEX METAL OXIDES; LANTHANUM ALUMINUM OXIDE; LANTHANUM CALCIUM MANGANATE OXIDE; LANTHANUM STRONTIUM MANGANATE OXIDE; SCANNING PROBE MICROSCOPY;

PEROVSKITE;

EID: 0029755374     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)