-
1
-
-
0004239503
-
-
Wadsworth, Pacific Grove, California
-
R. A. Becker, J. M. Chambers, and A. R. Wilks, The New S Language, Wadsworth, Pacific Grove, California, 1988.
-
(1988)
The New S Language
-
-
Becker, R.A.1
Chambers, J.M.2
Wilks, A.R.3
-
2
-
-
0004269485
-
-
Wadsworth, Pacific Grove, California
-
J. M. Chambers and T. Hastie, eds., Statistical Models in S, Wadsworth, Pacific Grove, California, 1992.
-
(1992)
Statistical Models in S
-
-
Chambers, J.M.1
Hastie, T.2
-
3
-
-
0039229369
-
-
Microsoft Corp., Redmond, Washington
-
Visual Basic Language Version 3.0, Microsoft Corp., Redmond, Washington, 1994.
-
(1994)
Visual Basic Language Version 3.0
-
-
-
4
-
-
0039229370
-
A Graphical User Interface for Spatial Data Analysis in Integrated Circuit Manufacturing
-
edited by M. Meyer and J. Rosenberg, Interface Foundation of North America, Fairfax Station, Virginia
-
L. Denby and D. A. James, "A Graphical User Interface for Spatial Data Analysis in Integrated Circuit Manufacturing," Computing Science and Statistics, Vol. 27, edited by M. Meyer and J. Rosenberg, Interface Foundation of North America, Fairfax Station, Virginia, 1995, pp. 212-219.
-
(1995)
Computing Science and Statistics
, vol.27
, pp. 212-219
-
-
Denby, L.1
James, D.A.2
-
5
-
-
0031200533
-
Monitoring Wafer Map Data from Integrated Circuit Fabrication Processes for Spatially Clustered Defects
-
forthcoming
-
M. H. Hansen, V. N. Nair, and D. Friedman, "Monitoring Wafer Map Data from Integrated Circuit Fabrication Processes for Spatially Clustered Defects," Technometrics, 1997 (forthcoming).
-
(1997)
Technometrics
-
-
Hansen, M.H.1
Nair, V.N.2
Friedman, D.3
-
7
-
-
10344264758
-
Model-Free Estimation of Some Yield Metrics in Semiconductor Manufacturing
-
Submitted to forthcoming
-
D. Friedman, M. H. Hansen, V. Nair, and D. A. James, "Model-Free Estimation of Some Yield Metrics in Semiconductor Manufacturing," Submitted to IEEE Transactions on Semiconductor Manufacturing, 1997 (forthcoming).
-
(1997)
IEEE Transactions on Semiconductor Manufacturing
-
-
Friedman, D.1
Hansen, M.H.2
Nair, V.3
James, D.A.4
-
8
-
-
0040413758
-
Process and Productivity Improvement in Semiconductor Manufacturing
-
edited by M. Meyer, Interface Foundation of North America, Fairfax Station, Virginia, June
-
M. H. Hansen and V. N. Nair, "Process and Productivity Improvement in Semiconductor Manufacturing," Computing Science and Statistics, Vol. 27, edited by M. Meyer, Interface Foundation of North America, Fairfax Station, Virginia, June 1995, pp. 3-7.
-
(1995)
Computing Science and Statistics
, vol.27
, pp. 3-7
-
-
Hansen, M.H.1
Nair, V.N.2
-
9
-
-
0041007936
-
-
StatSci Division of MathSoft Inc., Seattle, Washington
-
S-PLUS Software Documentation Version 3.3, StatSci Division of MathSoft Inc., Seattle, Washington, 1995.
-
(1995)
S-PLUS Software Documentation Version 3.3
-
-
-
10
-
-
77950049480
-
Evolution of the S Language
-
Interface Foundation of North America, Fairfax Station, Virginia
-
J. M. Chambers, "Evolution of the S Language," Computing Science and Statistics, Vol. 28, Interface Foundation of North America, Fairfax Station, Virginia, 1996.
-
(1996)
Computing Science and Statistics
, vol.28
-
-
Chambers, J.M.1
|