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Volumn 15, Issue 5, 1997, Pages 2508-2517

Effect of H2 addition on surface reactions during CF4/H2 plasma etching of silicon and silicon dioxide films

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[No Author keywords available]

Indexed keywords


EID: 0031513911     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580762     Document Type: Article
Times cited : (84)

References (27)
  • 1
    • 0004159739 scopus 로고    scopus 로고
    • National Academy, Washington, DC
    • National Research Council Panel on Database Needs for Modeling and Simulation of Plasma Processing, Database Needs for Modeling and Simulation of Plasma Processing (National Academy, Washington, DC, 1996).
    • (1996) Database Needs for Modeling and Simulation of Plasma Processing
  • 18
    • 0008004350 scopus 로고
    • edited by L. F. Thompson, C. G. Wilson, and M. J. Bowden American Chemical Society, Washington, DC
    • J. A. Mucha, D. Hess, and E. S. Aydil, in Introduction to Microlithography, edited by L. F. Thompson, C. G. Wilson, and M. J. Bowden (American Chemical Society, Washington, DC, 1994), p. 377.
    • (1994) Introduction to Microlithography , pp. 377
    • Mucha, J.A.1    Hess, D.2    Aydil, E.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.