Highlights of X-Ray Spectrometry for Microanalysis

X-Ray Spectrometry

Volumn 26, Issue 6, 1997, Pages 327-332

  Pella, P A ^a   Lankosz, M ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PROBE MICROANALYSIS; SPECTROMETRY;

CAPILLARY X-RAY OPTICS; COMMERCIALISATION; COMPOSITIONAL MAPPING; HISTORICAL PERSPECTIVE; LABORATORY INSTRUMENTATION; LOCALISED; X RAY FLUORESCENCE SPECTROMETRY; X RAY SPECTROMETRY;

FLUORESCENCE SPECTROSCOPY;

EID: 0031523972     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4539(199711/12)26:6<327::aid-xrs230>3.3.co;2-x     Document Type: Article

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