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Volumn 1, Issue 3, 1997, Pages 221-226
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Solid-state interdiffusion mechanism in strained Si1-xGex/Si heterostructures
a a a a a b b |
Author keywords
DCXD; Dislocation; MBE growth; SiGe heterointerface; Thermal interdiffusion
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Indexed keywords
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EID: 0031493935
PISSN: 14328488
EISSN: None
Source Type: Journal
DOI: 10.1007/s100080050052 Document Type: Article |
Times cited : (4)
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References (28)
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