Scanning probe microscopy of thermal conductivity and subsurface properties

Applied Physics Letters

Volumn 61, Issue 2, 1992, Pages 168-170

  Nonnenmacher, M ^a   Wickramasinghe, H K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

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[No Author keywords available]

Indexed keywords

EID: 0007994272     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.108207     Document Type: Article

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