Tunneling microscopic study of submicroscopic defects on the surfaces of loaded metals

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3345, Issue , 1997, Pages 226-231

  Vettegren, V I ^a   Rakhimov, S Sh ^a   Svetlov, V N ^a  

^a IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEFECTS; NITROGEN; PRISMS; SCANNING TUNNELING MICROSCOPY; SURFACE CHEMISTRY;

SUBMICROSCOPIC DEFECTS;

METALS;

EID: 0031393376     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.299600     Document Type: Conference Paper

References (7)

1. 15 as a response on the excited load
2. Scanning - Tunneling profilometer investigation of the evolution of the surface relief of loaded copper samples
3. Tunneling profilometer study of the dynamics of submicroscopic defects on the surface of loaded copper
4. Interference microscope study of the dynamics on the surface of loaded copper
5. Tunneling profilometer investigation of the evolution of submicron defects on a loaded gold surface
6. Tunneling profilometer study of the dynamic of submicrodefects on the surface of loaded molybdenum