Tunneling profilometer investigation of the evolution of submicron defects on a loaded gold surface

Physics of the Solid State

Volumn 38, Issue 2, 1996, Pages 323-325

  Vettegren', V I ^a   Svetlov, V N ^a   Rakhimov, S Sh ^a  

^a IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030531052     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

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6. V. I. Vettegren', S. Sh. Rakhimov, and V. N. Svetlov, Fiz. Tverd. Tela (St. Petersburg) 37(12), 3635 (1995) [Phys. Solid State 37, 2001 (1995)].
7. V. I. Vettegren', S. Sh. Rakhimov, and V. N. Svetlov, Fiz. Tverd. Tela (St. Petersburg) [Phys. Solid State] (in press).
8. V. I. Vettegren', S. Sh. Rakhimov, and V. N. Svetlov, Fiz. Tverd. Tela (St. Petersburg) [Phys. Solid State] (in press).
9. V. K. Adamchuk, Prib. Tekh. Éksp. 5, 182 (1989).