Data-driven self-timed RSFQ high-speed test system

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 4, 1997, Pages 3830-3833

  Deng, Zhong John ^b   Yoshikawa, Nobuyuki ^c   Whiteley, Stephen R ^d   Van Duzer, Theodore ^a,d  

^a IEEE

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Circuit testing; Digital integrated circuits; Digital measurements; High speed integrated circuits; Josephson device testing; Josephson logic; Superconducting circuits; Superconducting device testing

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS; QUANTUM ELECTRONICS; SUPERCONDUCTING DEVICES;

DATA DRIVEN SELF TIMED (DDST) CIRCUITS; JOSEPHSON DEVICE TESTING; RAPID SINGLE FLUX QUANTUM (RSFQ) LOGIC CIRCUITS; SUPERCONDUCTING CIRCUITS;

DIGITAL INTEGRATED CIRCUITS;

EID: 0031375214     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.659434     Document Type: Article

References (8)

1. K. K. Likharev and V. K. Semenov, "RSFQ logic/memory family: A new Josephson-junction technology for sub-terahertz-clock frequency digital systems," IEEE Trans. Appl. Superconduct., vol. 1, pp. 1-28, Mar. 1991.
2. O. Mukhanov, P. Bradley, S. Kaplan, S. Rylov, and A. Kirichenko, "Design and operation of RSFQ circuits for digital signal processing," in 5th Int. Superconductive Electronics Conf. ISEC'95, Nagoya, Japan, Sept. 18-21, 1995, pp. 27-30, extended abstracts.
3. O. Mukhanov, "Rapid single flux quantum (RSFQ) shift register family," IEEE Trans. Appl. Superconduct., vol. 3, pp. 2578-2581, Mar. 1993.
4. O. Mukhanov and A. F. Kirichenko, "Implementation of a FFT radix 2 butterfly using serial RSFQ multiplier-adder," IEEE Trans. Appl. Superconduct., vol. 5, pp. 2461-2464, June 1995.
5. Z. J. Deng, S. R. Whiteley, and T. Van Duzer, "Data-driven self-timing of RSFQ digital integrated circuits," in 5th Int. Superconductive Electronics Conf. ISEC'95, Nagoya, Japan, Sept. 18-21, 1995, pp. 189-191, extended abstracts.
6. Z. J. Deng, N. Yoshikawa, S. R. Whiteley, and T. Van Duzer, "Data-driven self-timed RSFQ digital integrated circuit and system," IEEE Trans. Appl. Superconduct., vol. 7, pp. 3634-3637, June 1997.
7. A. F. Kirichenko, O. Mukhanov, and A. Ryzhikh, "Advanced on-chip test technology for RSFQ circuits," IEEE Trans. Appl. Superconduct., vol. 7, pp.3438-3441, June 1997.
8. Z. J. Deng, N. Yoshikawa, U. Ghoshal, S. R. Whiteley, and T. Van Duzer, "20 Gb/s self-timed vector processing with Josephson single flux quantum technology," in Tech. Dig., 1997 Int. Solid-State Circuit Conf., ISSCC'97, San Francisco, Feb. 6-8, 1997, pp. 128-129.