Double 2p electron excitation in low-energy Ne+ single scattering from a Si surface: An energy loss study

Surface Science

Volumn 392, Issue 1-3, 1997, Pages

  Manico G ^a   Ascione, F ^a   Mandarino, N ^a   Bonanno, A ^a   Riccardi, P ^a   Alfano, P ^a   Zoccali, P ^a   Oliva, A ^a   Camarca, M ^a   Xu, F ^a  

^a UNIVERSITY OF CALABRIA   (Italy)

Author keywords

Atom solid scattering; Ion solid interactions; Low energy ion scattering; Noble gases; Silicon

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; IONIZATION OF GASES; NEON; SILICON;

ATOM SOLID SCATTERING; ION SOLID INTERACTIONS; LOW ENERGY ION SCATTERING;

ELECTRON TRANSITIONS;

EID: 0031366117     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00575-X     Document Type: Article

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