Electrically detected magnetic resonance at different microwave frequencies

Materials Science Forum

Volumn 258-263, Issue PART 2, 1997, Pages 963-968

  Brandt, M S ^a   Bayerl, M W ^a   Reinacher, N M ^a   Wimbauer, T ^a   Stutzmann, M ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

A Si:H; Electrically detected magnetic resonance; GaAs

Indexed keywords

AMORPHOUS SILICON; ELECTROMAGNETIC FIELD EFFECTS; ELECTRON ENERGY LEVELS; ELECTRON RESONANCE; MAGNETIC RELAXATION; MICROWAVES; SEMICONDUCTING GALLIUM ARSENIDE; THERMAL EFFECTS;

ELECTRICALLY DETECTED MAGNETIC RESONANCE; ZEEMAN LEVEL SPLITTING;

MAGNETIC RESONANCE;

EID: 0031358811     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.258-263.963     Document Type: Article

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