iDD pulse response testing: A unified approach to testing digital and analogue ICs

Electronics Letters

Volumn 29, Issue 24, 1993, Pages 2101-2103

  Beasley, J ^a   Ramamurthy, H ^a   Ramirez Angulo, J ^a   Deyong, M ^b  

^a NEW MEXICO STATE UNIVERSITY   (United States)

^b Intelligent Reasoning Systems Inc   (United States)

Author keywords

Circuit testing; Integrated circuits

Indexed keywords

DEFECTS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC CURRENTS; FREQUENCY RESPONSE; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; POWER SUPPLY CIRCUITS; SPECTRUM ANALYSIS; TRANSIENTS; VECTORS; VLSI CIRCUITS;

ANALOGUE CIRCUITS; FABRICATION VARIATIONS; PULSED POWER SUPPLY RAILS;

INTEGRATED CIRCUIT TESTING;

EID: 0027695991     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19931405     Document Type: Article

References (7)

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