Correction of energy-dependent systematic errors in dual-energy x-ray ct using a basis material coefficients transformation method

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 2, 1997, Pages 2419-2424

  Goh, K L ^a   Liew, S C ^b   Hasegawa, B H ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACRYLICS; ALUMINUM; BINARY MIXTURES; COMPOSITION EFFECTS; COMPUTER SIMULATION; ERROR CORRECTION; IODINE COMPOUNDS; MATHEMATICAL TRANSFORMATIONS; WATER; X RAY SPECTROSCOPY;

BASIS MATERIAL COEFFICIENTS TRANSFORMATION METHOD; DUAL ENERGY X RAY COMPUTED TOMOGRAPHY (DECT);

COMPUTERIZED TOMOGRAPHY;

EID: 0031342908     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.656446     Document Type: Article

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