Energy-dependent systematic errors in dual-energy X-ray CT

IEEE Transactions on Nuclear Science

Volumn 44, Issue 2, 1997, Pages 212-217

  Goh, K L ^a   Liew, S C ^a   Hasegawa, B H ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE ATTENUATION; ERROR ANALYSIS; MEASUREMENT ERRORS; MEDICAL IMAGING; X RAYS;

BASIS MATERIAL DECOMPOSITION TECHNIQUE; DUAL ENERGY X RAY COMPUTED TOMOGRAPHY (DECT);

COMPUTERIZED TOMOGRAPHY;

EID: 0031120191     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.568808     Document Type: Article

References (12)

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