Identification of Cu-related thermally stimulated current trap in undoped semi-insulating GaAs

Journal of Electronic Materials

Volumn 26, Issue 12, 1997, Pages

  Fang, Z Q ^a   Look, D C ^a   Jones, R L ^a  

^a WRIGHT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CRYSTAL DEFECTS; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRONS; PHOTOLUMINESCENCE; SEMICONDUCTOR GROWTH; SPECTROSCOPY;

COPPER RELATED TRAP; SEMI INSULATING GALLIUM ARSENIDE; THERMALLY STIMULATED CURRENT SPECTROSCOPY;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0031337776     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0064-1     Document Type: Article

References (16)

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