Photothermal measuring techniques using pulsed laser

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3244, Issue , 1997, Pages 249-256

  Neumann, Volker ^a   Meja, Peter ^a   Steiger, Bernhard ^a  

^a Hochschule Mittweida   (Germany)

Author keywords

Photothermal deflection microscopy; Photothermal reflectance microscopy; Photothermal techniques; Photothermal transmittance microscopy

Indexed keywords

LIGHT REFLECTION; LIGHT TRANSMISSION; MICROSCOPIC EXAMINATION; REFRACTIVE INDEX; THERMAL CONDUCTIVITY; THERMAL STRESS;

PHOTOTHERMAL TECHNIQUES;

LASER PULSES;

EID: 0031289927     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.306985     Document Type: Conference Paper

References (11)

1. Separation of surface and volume absorption by photothermal deflection
2. Influence of the probe beam size on the photothermal reflectance signal
3. Local measurements of thermal diffusivity in homogeneous and heterogenous samples by photoreflectance microscopy
4. Thermoelastic imaging using optical interferometer: Sensitivity optimization and super-resolution
5. Application of photothermal probe beam deflection technique for ablation and damage measurements by using short UV-laser pulses
6. Practicability of absorption measurements according to ISO/DIS 11551
7. Micrometer resolved inspection of defects and laser damage sites in UV high-reflecting coatings by photothermal displacement microscopy
8. Surface optical and laser damage characteristics of diamond-turned metal mirrors
9. 2 coatings