Practicability of absorption measurements according to ISO/DIS 11 551

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2870, Issue , 1996, Pages 495-501

  Steiger, Bernhard ^a   Pfeifer, Ute ^a   Meja, Peter ^a   Broulik, Ulrike ^a   Neumann, Volker ^a  

^a Fachbereich Mathematik Physik Informatik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

II-VI SEMICONDUCTORS; INFRARED DEVICES; SILICA; SUBSTRATES; WAVE PROPAGATION; ZINC SELENIDE;

ABSORPTION MEASUREMENTS; CALIBRATION FACTORS; IRRADIATED AREA; SAMPLE THICKNESS; SILICA SUBSTRATE; SUBSTRATE MATERIAL; TEMPERATURE CONDUCTIVITY; TEMPERATURE PROFILES;

LASER BEAMS;

EID: 0001346847     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.259935     Document Type: Conference Paper

References (3)

1. ISO/DIS 11 551; Optics and optical instruments - Lasers and laser-related equipment - Test method for absorptance of optical laser components 1995
2. D. Ristau, H. Niederwald, D. Erdelyi, P. Meja...; Round Robin Test on Optical Absorption at 10.6 μm; presented in Boulder Damage Symposium 1995
3. B. Steiger, P. Meja, U. Pfeifer, U. Broulik, V. Neumann; Verifikation der ISO-Normen zur Bestimmung der Zerstörschwelle und Absorption von optischen Komponenten im UV, NIR und FIR (Phase 1); Forschungsbericht (13EU0139) 1996