Focusing of hard X-rays with a W/Si supermirror

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 132, Issue 3, 1997, Pages 528-533

  Høghøj, Peter ^a,d   Ziegler, Eric ^a   Susini, Jean ^a   Freund, Andreas K ^a   Joensen, Karsten D ^b,e   Gorenstein, Paul ^b   Wood, James L ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

^c Osmic Inc   (United States)

^d INSTITUT LAUE LANGEVIN   (France)

^e UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

Hard x rays; Supermirror; W si multilayer; X ray focusing; X ray optics

Indexed keywords

FOCUSING; LIGHT ABSORPTION; LIGHT REFLECTION; MULTILAYERS; SILICON; TUNGSTEN; X RAYS;

SUPERMIRRORS; X RAY OPTICS;

MIRRORS;

EID: 0031276408     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00437-0     Document Type: Article

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