X-ray focusing using elliptically bent multilayers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2856, Issue , 1996, Pages 61-67

  Ziegler, E ^a   Hignette, O ^a   Lingham, M ^a   Souvorov, A ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRY; LUMINANCE; MIRRORS; MONOCHROMATORS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAYS;

DEMAGNIFICATION; FOCUSING DEVICE; MIRROR SURFACES; OPTICAL PROFILOMETER; ROCKING CURVE WIDTH; SYNCHROTRON BEAMLINES; TRIAL AND ERROR; W/SI MULTILAYERS;

MULTILAYERS;

EID: 0006439412     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.259850     Document Type: Conference Paper

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