Frumkin corrections for heterogeneous rate constants at semiconducting electrodes

Journal of Electroanalytical Chemistry

Volumn 438, Issue 1-2, 1997, Pages 191-197

  Royea, William J ^a   Krüger, Olaf ^a   Lewis, Nathan S ^a  

^a California Institute of Technology   (United States)

Author keywords

Accumulation condition; Depletion condition; Frumkin corrections; Heterogeneous rate constants; Semiconducting electrodes

Indexed keywords

FINITE DIFFERENCE METHOD; MATHEMATICAL MODELS; PHASE INTERFACES; REACTION KINETICS; REDOX REACTIONS; SEMICONDUCTOR DEVICES;

FRUMKIN CORRECTIONS; GOUY CHAPMAN STERN MODEL; POTENTIAL DROP; SEMICONDUCTING ELECTRODES;

ELECTROCHEMICAL ELECTRODES;

EID: 0031276286     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(96)05074-7     Document Type: Article

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