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Thin Solid Films

Volumn 310, Issue 1-2, 1997, Pages 148-155

Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity

(6) Calberg, C a Mertens, M a Jerome R a Arys, X b Jonas, A M b Legras, R b

a UNIVERSITY OF LIÈGE (Belgium)

b UNIVERSITÉ CATHOLIQUE DE LOUVAIN (Belgium)

Author keywords

Electrochemistry; Ellipsometry; Nickel; Polymers

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELLIPSOMETRY; GRAFTING (CHEMICAL); NICKEL; POLYACRYLONITRILES;

POLYACRYLONITRILE FILMS; X RAY REFLECTIVITY MEASUREMENTS;

PLASTIC FILMS;

EID: 0031275857 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00406-9 Document Type: Article

Times cited : (16)

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