Consistency of the surface roughness determined from soft-x-ray reflectance and surface profiles measured using a scanning tunnelling microscope: coherence length of the soft x-rays

Optical Review

Volumn 3, Issue 2, 1996, Pages 65-70

  Yanagihara, Mihiro ^a   Sasaki, Takuya ^a,b   Furudate, Minaji ^a   Yamamoto, Masaki ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b TOSHIBA CORPORATION   (Japan)

Author keywords

Coherence length; Reflectance; Soft x ray; STM; Surface roughness

Indexed keywords

EID: 0030493373     PISSN: 13406000     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10043-996-0065-y     Document Type: Article

References (10)

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