SCOPUS 정보 검색 플랫폼

Synthetic Metals

Volumn 77, Issue 1-3, 1996, Pages 161-164

Study of C60 thin films by scanning tunnelling microscopy: Pressure-induced transformation to an amorphous carbon phase

(3) Lang, H P a Thommen Geiser, V a Guntherodt H J a

a UNIVERSITY OF BASEL (Switzerland)

Author keywords

Amorphous carbon; Films; Fullerene; Microscopy

Indexed keywords

AMORPHOUS MATERIALS; CARBON; FULLERENES; GOLD; MOLECULES; PHASE TRANSITIONS; PRESSURE EFFECTS; SCANNING TUNNELING MICROSCOPY;

AMORPHOUS CARBON PHASE; ANGULAR DISTRIBUTION FUNCTIONS; NEAREST NEIGHBOR DISTANCE; PAIN DISTRIBUTION FUNCTIONS; PRESSURE INDUCED TRANSFORMATION; TUNNELING CURRENT;

THIN FILMS;

EID: 0030084877 PISSN: 03796779 EISSN: None Source Type: Journal
DOI: 10.1016/0379-6779(96)80079-8 Document Type: Article

Times cited : (6)

References (11)

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