Total dose radiation response of plasma-damaged NMOS devices

IEEE Electron Device Letters

Volumn 18, Issue 11, 1997, Pages 532-534

  Yue, Jerry ^a   Lo, Eddy ^a   Flanery, Mike ^a  

^a HONEYWELL TECHNOLOGY CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PLASMA APPLICATIONS; RADIATION EFFECTS; X RAYS;

PLASMA DAMAGED DEVICES; X RAY TOTAL DOSE IRRADIATION;

MOS DEVICES;

EID: 0031274778     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.641436     Document Type: Article

References (13)

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