메뉴 건너뛰기




Volumn 290, Issue 3-4, 1997, Pages 239-251

TEM analysis of planar defects induced by Ti doping in Bi-2212 single crystals

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL LATTICES; DOPING (ADDITIVES); SINGLE CRYSTALS; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031270737     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-4534(97)01634-1     Document Type: Article
Times cited : (3)

References (16)
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.